Objectives
Advanced substrates for wide band gap power devices in leading edge wafer size 200mm
- Objective 1: Innovation on advanced carrier wafer technologies for GaN devices
Silicon based raw wafers to expand the current power limits in leading edge wafer size 300mm
- Objective 2: Expand the limits in ON resistance of low ohmic power transistors
Reliability, compatibility to high volume CMOS fab's and benchmarking to best in class technologies
- Objective 3: Provide reliability test methodologies and analysis tools for novel GaN
MtM solution for high variability in chip packaging
- Objective 4: Enable MtM solution for high variability in chip packaging by advanced packaging technologies
Setup pilot line for GaN power devices
- Objective 5: Setup a pilot line for normally-on and normally-off GaN power devices including the GaN epitaxy and increase the wafer size in production to 200mm
Advanced packaging for GaN based devices including pilot line
- Objective 6: Enhance the compliance of GaN in standard packages and modules as well as a pilot line for system in package technology
Compact power and smart systems for smart energy
- Objective 7: Achieve benchmark size and power efficiency for the applications in the use cases defined
- Objective 8: Achieve significant improvement in energy management for selected smart power systems;